Xcam
|  Home  |  About Us  |  Contacts  |  Site Map  |  
 
 

Application Notes

This page contains information and links to downloadable .pdf documents describing CCD camera applications featuring Xcam hardware. The application notes listed are available as full technical notes or shorter double sided information sheets as indicated:


  • X-Ray Projection Microscopy with a CCD Detector

    X-Ray Projection Microscopy with a CCD Detector (Full technical note)
  •   Full technical note       X-Ray Projection Microscopy with a CCD Detector (Summary sheet)   Summary note

    This technical note describes the use of a custom CCD and headboard developed by Xcam in a novel X-ray projection microscopy technique that uses phase-contrast information to increase the resolution and information content of images.

  • X-Ray Non-Destructive Testing

    X-Ray Non-Destructive Testing (Full technical note)
  •   Full technical note       X-Ray Non-Destructive Testing (Summary sheet)   Summary note

    This technical note describes the use of an Xcam CCD camera system as the detector in a non-destructive X-ray testing application: the inspection of high voltage cable joints.

  • X-Ray Spectroscopy with a CCD Detector

    X-Ray Spectroscopy with a CCD Detector (Full technical note)
  •   Full technical note       X-Ray Spectroscopy with a CCD Detector (Summary sheet)   Summary note

    This technical note describes a number systems available from Xcam for X-ray spectroscopy applications, including systems for: multi-spectral imaging; large area/high spectral resolution using swept charge devices; combined imaging/spectroscopy.

  • Introduction to CCDs

    Introduction to CCDs (Full technical note)
  •   Full technical note

    This technical note provides an introduction to CCD operation and device structure and includes information on EMCCD and SCD devices.

     
    Copyright © 2007 Xcam Ltd. All rights reserved.  Designed by Qi3.  Pages maintained by Giraffe Design.