Application Notes

This page contains information and links to downloadable .pdf documents describing CCD camera applications featuring Xcam hardware. The application notes listed are available as full technical notes or shorter double sided information sheets as indicated:

Case Study: Custom CCD for X-ray Free Electron Laser Experiment   Full technical note          Poster This technical note describes the use of a custom Xcam large area CCD camera in the Japanese X-ray Free Electron Laser Experiment.

Large Camera for DESY FLASH XFEL Studies   Poster        This poster describes the use of an Xcam large area CCD camera in the FLASH beamline at DESY.

Xcam CCD Camera with e2v Technologies CCD42-90 or CCD44-82   Full technical note          Poster This technical note describes the use of e2v technologies large area CCDs in camera systems developed by Xcam. The poster describes the use of an Xcam large area CCD camera in XFEL studies.

X-Ray Projection Microscopy with a CCD Detector   Full technical note          Summary note This technical note describes the use of a custom CCD and headboard developed by Xcam in a novel X-ray projection microscopy technique that uses phase-contrast information to increase the resolution and information content of images.

X-Ray Non-Destructive Testing   Full technical note          Summary note This technical note describes the use of an Xcam CCD camera system as the detector in a non-destructive X-ray testing application: the inspection of high voltage cable joints.

X-Ray Spectroscopy with a CCD Detector   Full technical note          Summary note This technical note describes a number systems available from Xcam for X-ray spectroscopy applications, including systems for: multi-spectral imaging; large area/high spectral resolution using swept charge devices; combined imaging/spectroscopy.

Introduction to CCDs   Full technical note This technical note provides an introduction to CCD operation and device structure and includes information on EMCCD and SCD devices.