Application Notes

This page contains information and links to downloadable .pdf documents describing CCD camera applications featuring Xcam hardware. The application notes listed are available as full technical notes or shorter double sided information sheets as indicated:

X-Ray Projection Microscopy with a CCD Detector   Full technical note          Summary note This technical note describes the use of a custom CCD and headboard developed by Xcam in a novel X-ray projection microscopy technique that uses phase-contrast information to increase the resolution and information content of images.

X-Ray Non-Destructive Testing   Full technical note          Summary note This technical note describes the use of an Xcam CCD camera system as the detector in a non-destructive X-ray testing application: the inspection of high voltage cable joints.

X-Ray Spectroscopy with a CCD Detector   Full technical note          Summary note This technical note describes a number systems available from Xcam for X-ray spectroscopy applications, including systems for: multi-spectral imaging; large area/high spectral resolution using swept charge devices; combined imaging/spectroscopy.

Introduction to CCDs   Full technical note This technical note provides an introduction to CCD operation and device structure and includes information on EMCCD and SCD devices.